Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope
نویسندگان
چکیده
منابع مشابه
Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope.
Beam damage caused by energetic electrons in the transmission electron microscope is a fundamental constraint limiting the collection of artifact-free information. Through understanding the influence of the electron beam, experimental routines may be adjusted to improve the data collection process. Investigations of CeO2 indicate that there is not a critical dose required for the accumulation o...
متن کاملthe scanning electron microscope
it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...
متن کاملElectron microscopy’s multi-tool: the Scanning Transmission Electron Microscope
A dedicated Scanning Transmission Electron Microscope is ideally coupled with the energy dispersive x-ray and electron energy loss spectroscopies to obtain information about the chemical composition, morphology and electronic structure on the nanoscale. With several signals being available simultaneously with the pass of a subnanometre-sized beam, this instrument can answer questions from a bro...
متن کاملX-ray Microanalysis of Cultured Cells in the Scanning Electron Microscope and in the Scanning Transmission Electron Microscope: a Comparison
X-ray microanalysis of cultured cells as “whole mounts” (i.e., not sectioned) is used frequently e.g., to study mechanisms of ion transport. Cells can be cultured either on solid substrates or on thin plastic films on grids. Cells cultured on solid substrates are analyzed in the scanning electron microscope at relatively low accelerating voltage, cells cultured on thin films can be analyzed in ...
متن کاملRadiation damage to fullerite „C60... in the transmission electron microscope
Electron energy-loss spectroscopy was used to monitor structural damage to solid C60 as a function of electron exposure. The characteristic dose was found to be in the range 300–700 C/cm for incident energies in the range 100–200 keV and specimen temperatures between 100 and 300 K. The absolute value of this dose, and its energy and temperature dependence, suggest that the damage mechanism is p...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2016
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2016.07.002